The designer solves the transfer-matrix method (TMM) for a stratified medium: each layer contributes a 2×2 characteristic matrix built from its complex refractive index ñ = n + ik and phase thickness, the matrices multiply through the stack, and reflectance, transmittance and absorptance follow from the resulting amplitude coefficients. It is the same formalism used by commercial thin-film software, applied without approximation from X-ray to infrared wavelengths.
Interface roughness
Real interfaces are never atomically sharp. Each interface accepts an RMS roughness σ, applied through the Névot–Croce factor — the standard correction in X-ray and EUV multilayer work, where sub-nanometre roughness dominates achievable reflectivity. Because it is a real physical parameter rather than a fudge factor, you can use it to ask honest questions: how good does my polishing have to be?
Substrates handled properly
A 0.5 mm glass window is thousands of wavelengths thick, so its front and back surfaces do not interfere coherently. The tool models a thick substrate incoherently, the way a spectrophotometer actually measures it, with optional back-surface reflection — so a transmittance number means what you would measure on a bench. Semi-infinite substrates and free-standing membranes (where both faces do interfere) are separate modes.
Where the optical constants come from
67 materials and 122 datasets, compiled from curated public sources: refractiveindex.info (CC0 public domain) for the optical range, and CXRO/IMD compilations for X-ray and EUV. Every dataset carries its source, data type, valid range and licence, visible in the app next to each layer. Where several datasets exist for one material, you can pin the one you trust — because for sputtered films the difference between two literature sources is often larger than the effect you are trying to design.
Verification
The engine is checked against analytic references on every build: bare-substrate Fresnel reflectance, an incoherent glass slab, a quarter-wave AR coating, Brewster's angle for p-polarised light, energy conservation in lossless stacks, and a Mo/Si EUV multilayer against published reflectivity. Every bundled example design also carries machine-checked acceptance criteria, so the numbers quoted in each preset note are re-verified whenever the material data changes.